Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. In this episode, Thomas Betts chats with ...
When using functional test sequences, test compaction is important to avoid excessive numbers of clock cycles of test application. However, test compaction procedures for binary sequences at the ...
Representing the most recent generation of double-data-rate (DDR) SDRAM memory, DDR4 and low-power LPDDR4 together provide improvements in speed, density, and power over DDR3. However, such speed and ...
Where functional safety risks need to be controlled, relying solely on EMC testing is inadequate, no matter how high the test levels are cranked up. Further, many engineers and project managers are ...
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