Mouser Electronics, Inc. announced the availability of Cypress’ parallel FRAM non-volatile memory featuring advanced high-reliability ferroelectric process and superior to battery-backed SRAM modules.
Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...
Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...