Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Researchers have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the transfer of quantum information ...
Description: Structures and interactions of point, line, and planar defects in solids, with emphasis on properties of defects. Generic basis of defect energies and interactions, with reference to ...
Researchers at The City College of New York have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the ...
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