The United States accused China on Friday of failing to disclose a 2020 nuclear test, violating what a US official suggested was an understanding involving a 1996 nuclear test ban treaty that both ...
Abstract: Dynamic characterization of silicon carbide (SiC) MOSFET bare dies is essential but challenging due to their inherently fast switching speed, which makes them highly susceptible to parasitic ...
Abstract: The goal of this work is to ascertain the implications of testing procedures on dielectric strength and Partial Discharge Inception Voltage (PDIV) across a range of organic materials. This ...
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